User Solution
TestStand and LabVIEW reduce the time to characterize high-performance integrated circuits for ATMEL
| Author (s): Daravan LY - Atmel Jean-Louis Schricke - Mesulog
Industry (s): Test / Instrumentation, Telecommunications, Semiconductors
Product (s): Drivers and IVI instrument, GPIB, LabVIEW, TestStand, Connecting instrument
Objective: Characterize high-performance integrated circuits.
The solution: Set up a test automated sequencer using TestStand, LabVIEW and test sheets. |
Atmel designs, manufactures and markets integrated
circuits that include CCD and CMOS imagers, high-reliability
microprocessors, converters and fast ASIC. The "product support
applications (R & D) is, among other things, responsible for the
characterization of converters (CA/N-C N / A) and RF. In 1996, a first bench test was developed in C
on the Macintosh, but it posed problems of evolution, introduction of
new products and automation measures. To reduce the time to
characterize its circuits, Atmel has developed a specification and has
triggered a study of core software entrusted to the company Mesulog
partner National Instruments. The purpose of this bench was to be able
to automatically characterize and comprehensively CAN components and RF
operating in their application environments. The laboratory application
development uses many different instruments on test benches (power
supplies, multimeters, RF generators, oscilloscopes, bolometers,
spectrum analyzers, logic analyzers). Fungibility in the same class of
instruments was required. In addition, the chassis had to provide a
means of processing and analyzing the results, for the sake of
flexibility, rapid and traceability.
Implementation
The purpose of the specification Atmel was to have a chassis
incorporating a modular sequencer test to characterize a wide range of
products, each with its specificities. We needed a solution that
combines standardized, interactive modification of the conditions of
testing and scalability. The original idea was to link a spreadsheet to
test sequencer TestStand.
An Excel workbook, called "form of measurement, allows the user
to select the instruments used to validate and set the measurement
loop, collecting the measurements and present results in graphical
form. Each form is associated with a TestStand sequence and allows to
test one or more products.
The sequencer TestStand executes a sequence of tests not
developed in LabVIEW. More than 500 VIs are called at runtime. Library
functions decode the Excel files, drives the instruments, configure the
circuit to be tested, performing the measurements, calculate and format
the results.
Traceability is ensured by the fact that the measurement report contains both the parameters and test results.
At the end of the test, which can last several hours, the
applicant receives an email containing a link to the measurement
report.
To ensure the modularity of equipment tests, Mesulog use the
server tools developed by Sapphire, which enables the
interchangeability of the instruments with VISA and IVI drivers, and
the creation of new classes of instruments.
Results
The solution set for Atmel provides an automatic bench which
increases the number of measures, while reducing by ten time
characterization. The use of cards facilitates the configuration and
testing to ensure traceability.
This new chassis is now based on an open architecture that can
evolve easily. Indeed, the sequencer TestStand allows rapid
modification of test sequences and the addition of new features by
creating new generic and not specific.
Atmel users appreciate this new tool that enables them to
achieve their objectives in terms of extent of characterization,
reliability measures, computing power and response time to new customer
demands.
This bench allows Atmel to anticipate problems related to
design, secure the validity of functional circuits and reduce the time
and cost of characterization.
October 2004
Author information:
Daravan LY
Atmel
Avenue de Rocheplaine BP123
38521 Saint Egrève
France
Tel: 0033 4.76.58.32.72
daravan.ly @ gfo.atmel.com